By Peter W. Hawkes
Advances in Imaging & Electron Physics merges long-running serials-Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The sequence gains prolonged articles at the physics of electron units (especially semiconductor devices), particle optics at low and high energies, microlithography, photograph technology and electronic photograph processing, electromagnetic wave propagation, electron microscopy, and the computing equipment utilized in these types of domains.
- Contributions from prime professionals
- Informs and updates on the entire most up-to-date advancements within the field
Read or Download Advances in Imaging and Electron Physics, Volume 183 PDF
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Additional info for Advances in Imaging and Electron Physics, Volume 183
Scanning, 30, 2–15. El-Gomati, M. , & Wilson, K. (2005). Why is it possible to detect doped regions of semiconductors in low-voltage SEM: A review and update. Surface and Interface Analysis, 37, 901–911. El-Gomati, M. , Wells, T. R. , & Jayakody, H. (2004). IEEE Transactions on Electron Devices, 51(2), 288–292. Everhart, T. , & Thornley, R. F. M. (1960). Wide-band detector for micro-microampere low-energy electron currents. Journal of Scientiﬁc Instruments, 37, 246–248. Fernandez-Varea, J. , & Salvat, F.
Ding, Z. J. (2011). Monte Carlo Simulation of SEM and SAM Images, Chapter 11, in Applications of Monte Carlo Method in Science and Engineering. ). com/books/applications-of-monte-carlo-methodin-science-and-engineering/monte-carlo-simulation-of-sem-and-sam-images. Liu, J. (2003). The versatile FEG-SEM: From ultrahigh resolution to ultrahigh surface sensitivity. Microscopy and Microanalysis, 9, 144–145. McKay, K. G. (1948). Secondary electron emission. In Recent Advances in Electronics. New York: Academic Press.
1 nm for Hf ). This suggests that the model 26 Mohamed M. El-Gomati and Christopher G. H. Walker used was not correct in some way. Whatever the model, the data suggest that the SEs are being generated very close to the surface for some elements. Lin and Joy (2005) also found very low IMFP for some elements. One possibility for the generation of large numbers of SEs at the surface is that the SEs are due to the decay of surface plasmons, not volume plasmons as is assumed in our model. , Koshikawa & Shimizu 1974).